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Article
| Title: | In situ monitoring of X-ray strain pole figures of a biaxially deformed ultra-thin film on a flexible substrate |
|---|---|
| Author(s): | G. Geandier, D. Faurie, P.-O. Renault, D. Thiaudière and E. Le Bourhis |
| Journal: | Journal of Applied Crystallography |
| Year: | 2014 |
| Volume: | 47 |
| Pages: | 181-187 |
| DOI: | 10.1107/S1600576713030720 |
| Note: | Département SI2M : Microstructures et Contraintes |