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Title: In situ monitoring of X-ray strain pole figures of a biaxially deformed ultra-thin film on a flexible substrate
Author(s): G. Geandier, D. Faurie, P.-O. Renault, D. Thiaudière and E. Le Bourhis
Journal: Journal of Applied Crystallography
Year: 2014
Volume: 47
Pages: 181-187
DOI: 10.1107/S1600576713030720
Note: Département SI2M : Microstructures et Contraintes

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