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Title: Interfacial trapping for hot electron injection in silicon
Author(s): Y. Lu, D. Lacour, G. Lengaigne, S. Le Gall, S. Suire, F. Montaigne and M. Hehn
Journal: Applied Physics Letters
Year: 2013
Volume: 103
Issue: 2
File URL:
Note: Département P2M : Nanomagnétisme et Electronique de Spin

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