Title: | Interfacial trapping for hot electron injection in silicon |
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Author(s): | Y. Lu, D. Lacour, G. Lengaigne, S. Le Gall, S. Suire, F. Montaigne and M. Hehn |
Journal: | Applied Physics Letters |
Year: | 2013 |
Volume: | 103 |
Issue: | 2 |
File URL: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84880475078&partnerID=40&md5=b00d9fdada7fce71fc7dc6fbe33054c7 |
Note: | Département P2M : Nanomagnétisme et Electronique de Spin |