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Title: Real time atomic force microscopy imaging during nanogap formation by electromigration
Author(s): S. Girod, J.-L. Bubendorff, F. Montaigne, L. Simon, D. Lacour and M. Hehn
Journal: Nanotechnology
Year: 2012
Volume: 23
Issue: 36
File URL: http://www.scopus.com/inward/record.url?eid=2-s2.0-84865440282&partnerID=40&md5=82f9bb53cb0a288d96916f753dad96ae
Note: Département P2M : Nanomagnétisme et Electronique de Spin

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