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MATERIALS & DESIGN,
56:280-285
2014
ISSN: 0261-3069
Equipe: Département CP2S : Métallurgie et Surfaces |
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Materials & Design,
56:280--285
2014
Equipe: Centre de Compétences : Matériaux et Procédés additifs |
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Journal of Materials Processing Technology,
214(12):3108--3111
2014
Mots clefs: Additive manufacturing, Complex metallic alloys, Icosahedral Al–Cu–Fe–B, Phase transformations Equipe: Centre de Compétences : Matériaux et Procédés additifs |
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JOURNAL OF MATERIALS PROCESSING TECHNOLOGY,
214(12):3108-3111
2014
ISSN: 0924-0136
Equipe: Département CP2S : Métallurgie et Surfaces |
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JOURNAL OF PHYSICAL CHEMISTRY C,
118(40):23032-23041
2014
ISSN: 1932-7447
DOI: 10.1021/jp504906r
Equipe: Département CP2S : Métallurgie et Surfaces |
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PHYSICAL REVIEW B,
89(8)
2014
ISSN: 1098-0121
Equipe: Département P2M : Surfaces et Spectroscopies |
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Journal of Applied Physics,
115(17)
2014
Equipe: Département P2M : Nanomagnétisme et Electronique de Spin |
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ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE,
640(5, SI):753-759
2014
ISSN: 0044-2313
Equipe: Département CP2S : Métallurgie et Surfaces |
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SURFACE AND INTERFACE ANALYSIS,
46(1, SI):397-400
Audinot, JN (Reprint Author), Ctr Rech Publ Gabriel Lippmann, SAM Dept, 41 Rue Brill, L-4422 Belvaux, Luxembourg. Audinot, J. -N.; Grysan, P.; Fleming, Y., Ctr Rech Publ Gabriel Lippmann, SAM Dept, L-4422 Belvaux, Luxembourg. Hamdan, A.; Noel, C.; Kosior, F.; Henrion, G.; Belmonte, T., Univ Lorraine, Inst Jean Lamour, CNRS, UMR 7198,CS 50840, F-54011 Nancy, France.
2014
ISSN: 0142-2421
DOI: 10.1002/sia.5635
Mots clefs: imaging; combinaison; characterization; plasma; nanosims; 3D Resume: The discharge between a platinum electrode and different metallic monolayers on a silicon substrate produced sub-micrometric structures. The scanning electron microscope images showed the formation of craters with cones, holes, corona, and other exotic structures. The atomic force microscopy images allowed evaluating the depth and height of these complex structures together with the chemical information as determined by NanoSIMS imaging. The plasma impacts locally removed the mono-layer and the bilayer down to the bare silicon substrate. In order to convert the acquired NanoSIMS images into a true three-dimensional distribution of the analyzed species, the SIMS images are overlapped with the corresponding atomic force microscopy images of the same probed area. This analysis method allows a visualization of a complex 3D structure and helps understand the formation mechanisms of the streamer impact. Copyright (c) 2014 John Wiley & Sons, Ltd. Equipe: Centre de Compétences : ERMIONE informatique et calcul |
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SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS,
15(2)
2014
ISSN: 1468-6996
Equipe: Département CP2S : Métallurgie et Surfaces |