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Publications: Articles

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References

Articles:

Le Gall, S., Cucchiara, J., Gottwald, M., Berthelot, C., Lambert, C.-H., Henry, Y., Bedau, D., Gopman, D.B., Liu, H., Kent, A.D., Sun, J.Z., Lin, W., Ravelosona, D., Katine, J.A., Fullerton, E.E. and Mangin, S.
Physical Review B - Condensed Matter and Materials Physics, 86(1)
2012

Equipe: Centre de Compétences : MiNaLor micro et nanotechnologies

AYDEMIR, U., CANDOLFI, C., ORMECI, A., BORRMANN, H., BURKHARDT, U., OZTAN, Y., OESCHLER, N., BAITINGER, M., STEGLICH, F. and GRIN, YU.
Inorganic chemistry, 51:4730
2012

Equipe: Département CP2S : Matériaux à propriétés thermoélectriques

Li, X., Basso, M. C., Braghiroli, F. L., Fierro, V., Pizzi, A. and Celzard, A.
Carbon, 50:2026 â?? 2036
2012

Equipe: Département CP2S : Matériaux Carbonés

BOILEAU, A., Capon, F., BARRAT, S., Laffez, P. and Pierson, J.F.
Journal of Applied Physics, (acceptEe)
2012

Equipe: Département CP2S : Elaboration et Fonctionnalité de Couches Minces

Liu, H., Bedau, D., Sun, J.Z., Mangin, S., Fullerton, E.E., Katine, J.A. and Kent, A.D.
Physical Review B - Condensed Matter and Materials Physics, 85(22)
2012

Equipe: Département P2M : Nanomagnétisme et Electronique de Spin

yen, R. Nguyen van, Fedorczak, N., Brochard, F., Bonhomme, G., Schneider, K., Farge, M. and Garbet, P. Monier-
Nucl. Fusion, 52:013005 (11 pages)
2012

Resume: Images acquired by cameras installed in tokamaks are difficult to interpret because the three-dimensional structure of the plasma is flattened in a non-trivial way. Nevertheless, taking advantage of the slow variation of the fluctuations along magnetic field lines, the optical transformation may be approximated by a generalized Abel transform, for which we propose an inversion technique based on the wavelet-vaguelette decomposition. After validation of the new method using an academic test case and numerical data obtained with the Tokam 2D code, we present an application to an experimental movie obtained in the tokamak Tore Supra. A comparison with a classical regularization technique for ill-posed inverse problems, the singular value decomposition, allows us to assess the efficiency. The superiority of the wavelet-vaguelette technique is reflected in preserving local features, such as blobs and fronts, in the denoised emissivity map.

Equipe: Département CP2S : Expériences et Simulations des Plasmas Réactifs - Interaction plasma-surface et Traitement des Surfaces ESPRITS

S. Bulou, L. Le-Brizoual, P. Miska, L. De-Poucques, R. Hugon, J. Bougdira and Belmahi., M.
Surface and Coatings Technology, 208:46
2012

Equipe: Département CP2S : Expériences et Simulations des Plasmas Réactifs - Interaction plasma-surface et Traitement des Surfaces ESPRITS

Borgese, L., Gelfi, M., Bontempi, E., Goudeau, P., Geandier, G., Thiaudière, D. and Depero, L. E.
Surface and Coatings Technology, 206(8-9):2459-2463
2012
ISSN: 0257-8972

Resume: Atomic Layer Deposition (ALD) allows the deposition of thin films onto flat as well as complex geometry surfaces with excellent conformality. Thicknesses of few atomic layers can be achieved. Moreover, low-temperature deposition is possible and this enables the change of surface properties of many kinds of materials. Good adhesion characteristics and also good mechanical performance of ALD deposited thin films make the technique extremely interesting for several applications, as for example micro-electronics. TiO2 is a well studied semiconductor material because of its multifunctional properties that open a wide range of applications for example in photocatalysis, optics and solar cells. ALD is extremely completive to other technique, to deposit titania thin films, employed even to improve the biocompatibility of many kind of materials. TiO2 thin films are deposited with ALD technique at low temperature (90 degrees C) onto Kapton substrate and then crystallized ex-situ after annealing at 300 degrees C. X-ray diffraction (XRD) techniques are very suitable for the analysis of structure and microstructure of films and surface layers. In this work, XRD in combination with in situ tensile testing has been applied for the first time to measure elastic properties (elastic modulus and Poisson ratio) of TiO2 anatase thin films obtained by ALD. For the experimental conditions, the tensile stage was installed in a Synchrotron laboratory of Soleil. The information extracted from diffraction patterns is presented. (C) 2011 Elsevier B.V. All rights reserved.

Equipe: Département SI2M : Microstructures et Contraintes

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