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2014

Articles:

Kenzari, Samuel, Bonina, David, Dubois, Jean Marie and Fournee, Vincent
SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS, 15(2)
2014
ISSN: 1468-6996

Equipe: Département CP2S : Métallurgie et Surfaces

Kenzari, Samuel, Bonina, David, Dubois, Jean Marie and Fournee, Vincent
Science and Technology of Advanced Materials, 15(2):024802
2014

Equipe: Centre de Compétences : Matériaux et Procédés additifs

Sicot, M., Fagot-Revurat, Y., Kierren, B., Vasseur, G. and Malterre, D.
APPLIED PHYSICS LETTERS, 105(19)
2014
ISSN: 0003-6951

Equipe: Département P2M : Surfaces et Spectroscopies

K. Tillous, E., Dulcy, J. and Belmonte, T.
Oxidation of Metals, 82:163-179
2014

Equipe: Département CP2S : Expériences et Simulations des Plasmas Réactifs - Interaction plasma-surface et Traitement des Surfaces ESPRITS

Liu, H., Bedau, D., Sun, J.Z., Mangin, S., Fullerton, E.E., Katine, J.A. and Kent, A.D.
Journal of Magnetism and Magnetic Materials, 358-359:233-258
2014

Equipe: Département P2M : Nanomagnétisme et Electronique de Spin

Vasseur, G., Fagot-Revurat, Y., Kierren, B., Sicot, M. and Malterre, D.
PHYSICAL REVIEW B, 89(12)
2014
ISSN: 1098-0121

Equipe: Département P2M : Surfaces et Spectroscopies

Kuete Saa, D., Cardoso, R.P., Kosior, F., Altaweel, A., Gries, T., Laminsi, S. and Belmonte, T.
Surface and Coatings Technology, 255:3-7
2014

Equipe: Département CP2S : Expériences et Simulations des Plasmas Réactifs - Interaction plasma-surface et Traitement des Surfaces ESPRITS

Saa, D. Kuete, Cardoso, R. P., Kosior, F., Al Taweel, A., Gries, T., Laminsi, S. and Belmonte, T.
SURFACE & COATINGS TECHNOLOGY, 255:3-7 Belmonte, T (Reprint Author), Univ Lorraine, Inst Jean Lamour, UMR CNRS 7198, F-54042 Nancy, France. Saa, D. Kuete; Kosior, F.; Al Taweel, A.; Gries, T.; Belmonte, T., Univ Lorraine, Inst Jean Lamour, UMR CNRS 7198, F-54042 Nancy, France. Saa, D. Kuete; Laminsi, S., Univ Yaounde I, Lab Chim Minerale, Yaounde 812, Cameroon. Cardoso, R. P., Univ Fed Parana, BR-81531990 Curitiba, Parana, Brazil. Gries, T.; Belmonte, T., CNRS, Inst Jean Lamour, UMR CNRS 7198, F-54042 Nancy, France.
2014
ISSN: 0257-8972

Mots clefs: RuO2; Nanostructuration; Localized growth; Micro-plasma; Afterglow

Resume: Various ruthenium dioxide nanostructures were grown locally by the oxidation of ruthenium samples with an Ar-O-2 microwave micro-afterglow operated at atmospheric pressure. A special attention was paid to the distribution of the surface temperature of the sample which evolves between 530 K and 820 K. Whatever the treatment time, the temperature and the gas composition set within the studied ranges, a general nanostructure, made of lamellae separated by 20-50 nm, is found. When the temperature rises, localized nano-sea urchins, nanotubes with square sections, nano-needles, and more complex structures are found spread over the surface. Treated surfaces were characterized by different surface diagnostics (SEM, XRD, SIMS, etc.) Finally, a growth mechanism is proposed emphasizing the role of emerging defects and stress on the appearance of localized nanostructures. (C) 2013 Elsevier B.V. All rights reserved.

Equipe: Centre de Compétences : ERMIONE informatique et calcul

Geandier, G., Dehmas, M., Mourot, M., Aeby-Gautier, E., Denis, S., Martin, O. and Karnatak, N.
Journal of heat treatments and materials, 69:54--59
2014

Equipe: Département SI2M : Microstructures et Contraintes

Belmonte, T., Hamdan, A., Kosior, F., Noel, C. and Henrion, G.
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 47(22, SI) Belmonte, T (Reprint Author), Univ Lorraine, CNRS, Dept CP2S, Inst Jean Lamour, Parc Saurupt,CS 50840, F-54011 Nancy, France. Belmonte, T.; Hamdan, A.; Kosior, F.; Noel, C.; Henrion, G., Univ Lorraine, CNRS, Dept CP2S, Inst Jean Lamour, F-54011 Nancy, France.
2014
ISSN: 0022-3727

Mots clefs: discharges in liquids; plasma-surface interactions; nanoparticle synthesis

Resume: Discharge-surface interaction in liquids includes many phenomena which are reviewed in this work. This is used to examine results in the area of nanoparticle synthesis and to propose a general sketch of formation mechanisms.

Equipe: Centre de Compétences : ERMIONE informatique et calcul

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