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References

2012

Articles:

Pigeau, B., Hahn, C., De Loubens, G., Naletov, V.V., Klein, O., Mitsuzuka, K., Lacour, D., Hehn, M., Andrieu, S. and Montaigne, F.
Physical Review Letters, 109(24)
2012

Equipe: Centre de Compétences : MiNaLor micro et nanotechnologies

Briquet, L.G.V., Jana, A, Mether, L., Nordlund, K., Henrion, G., Philipp, P. and WIRTZ, T.
J. Phys. Cond. Mat., 24:395004 (13 pp)
2012

Resume: In this paper a new interatomic potential based on the Kieffer force field and designed to perform molecular dynamics (MD) simulations of carbon eposition on silicon surfaces is implemented. This potential is a third-order reactive force field that includes a dynamic charge transfer and allows for the formation and breaking of bonds. The parameters for Si-C and C-C interactions are optimized using a genetic algorithm. The quality of the potential is tested on its ability to model silicon carbide and diamond physical properties as well as the formation energies of point defects. Furthermore, MD simulations of carbon deposition on reconstructed (100) silicon surfaces are carried out and compared to similar simulations using a Tersoff-like bond order potential. Simulations with both potentials produce similar results showing the ability to extend the use of the Kieffer potential to deposition studies. The investigation reveals the presence of a channelling effect when depositing the carbon at 45 incidence angle. This effect is due to channels running in directions symmetrically equivalent to the (110) direction. The channelling is observed to a lesser extent for carbon atoms with 30 and 60 incidence angles relative to the surface normal. On a pristine silicon surface, sticking coefficients were found to vary between 100 and 73%, depending on deposition conditions.

Equipe: Département CP2S : Expériences et Simulations des Plasmas Réactifs - Interaction plasma-surface et Traitement des Surfaces ESPRITS

Wang, F., Shepperd, K., Hicks, J., Nevius, M. S., Tinkey, H., Tejeda, A., Taleb-Ibrahimi, A., Bertran, F., Le Fèvre, P., Torrance, D. B., First, P. N., de Heer, W. A., Zakharov, A. A. and Conrad, E. H.
PHYSICAL REVIEW B, 85(16)
2012
ISSN: 1098-0121

Equipe: Département P2M : Surfaces et Spectroscopies

Bonell, F., Hauet, T., Andrieu, S., Bertran, F., Le Fèvre, P., Calmels, L., Tejeda, A., Montaigne, F., Warot-Fonrose, B., Belhadji, B., Nicolaou, A. and Taleb-Ibrahimi, A.
Physical Review Letters, 108(17)
2012

Equipe: Département P2M : Nanomagnétisme et Electronique de Spin

Bonell, F., Hauet, T., Andrieu, S., Bertran, F., Le Fèvre, P., Calmels, L., Tejeda, A., Montaigne, F., Warot-Fonrose, B., Belhadji, B., Nicolaou, A. and Taleb-Ibrahimi, A.
PHYSICAL REVIEW LETTERS, 108(17)
2012
ISSN: 0031-9007

Equipe: Département P2M : Surfaces et Spectroscopies

Bonell, F., Hauet, T., Andrieu, S., Bertran, F., Le Fèvre, P., Calmels, L., Tejeda, A., Montaigne, F., Warot-Fonrose, B., Belhadji, B., Nicolaou, A. and Taleb-Ibrahimi, A.
Physical Review Letters, 108(17)
2012

Equipe: Centre de Compétences : MiNaLor micro et nanotechnologies

Cui, C., Nugent, P. J., Shimoda, M., Ledieu, J., Fournee, V., Tsai, A. P., McGrath, R. and SHARMA, H. R.
JOURNAL OF PHYSICS-CONDENSED MATTER, 24(44)
2012
ISSN: 0953-8984

Equipe: Département CP2S : Métallurgie et Surfaces

2011

Articles:

Belmonte, T., Bernardelli, E. A., Mafra, M., Duday, D., Frache, G., Poncin-Epaillard, F., Noel, C., Choquet, P., Migeon, H. N. and Maliska, A. M.
Surface & Coatings Technology, 205:S443-S446
2011

Equipe: Département CP2S : Expériences et Simulations des Plasmas Réactifs - Interaction plasma-surface et Traitement des Surfaces ESPRITS

Reckers, N., Cucchiara, J., Posth, O., Hassel, C., Römer, F.M., Narkowicz, R., Gallardo, R.A., Landeros, P., Zähres, H., Mangin, S., Katine, J.A., Fullerton, E.E., Dumpich, G., Meckenstock, R., Lindner, J. and Farle, M.
Physical Review B - Condensed Matter and Materials Physics, 83(18)
2011

Equipe: Département P2M : Nanomagnétisme et Electronique de Spin

Mases, M., Noël, M., Mercier, G., Dossot, M., Vigolo, B., Mamane, V., Fort, Y., Soldatov, A. V. and McRae, E.
Phys. Stat. Sol. B. , 248:2552-2555
2011

Equipe: Département CP2S : Matériaux Carbonés

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