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Publications: Articles

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References

Articles:

SHARMA, H. R., Fournee, V., Shimoda, M., Ross, A. R., Lograsso, T. A., Gille, P. and Tsai, A. P.
PHYSICAL REVIEW B, 78(15)
2008
ISSN: 1098-0121

Equipe: Département CP2S : Métallurgie et Surfaces

RAPIN, C., PODOR, R., GASSERT, J. and VILASI, M.
Materials Science Forum, 595-598:1119-1126
2008

Equipe: Département CP2S : Surface et Interface, réactivité chimique des matériaux

Diliberto, S., Richoux, V., Stein, N. and Boulanger, C.
Physica Status Solidi a-Applications and Materials Science, 205(10):2340-2344
2008

Equipe: Département CP2S : Chimie et électrochimie des matériaux

RAPIN, C., PODOR, R., VILASI, M., BERTHOD, P. and STEINMETZ, P.
Verre, 4(1):8-10
2008

Equipe: Département CP2S : Surface et Interface, réactivité chimique des matériaux

Morniroli, J. P., Houdellier, F., Roucau, C., Puiggali, J., Gesti, S. and Redjaïmia, A.
Ultramicroscopy, 108 (2)(2):100-115
2008
ISSN: 0304-3991

Resume: By combining the large-angle convergent-beam electron diffraction (LACBED) configuration together with a microscope equipped with a C., corrector it is possible to obtain good quality spot patterns in image mode and not in diffraction mode as it is usually the case. These patterns have two main advantages with respect to the conventional selected-area electron diffraction (SAED) or microdiffraction patterns. They display a much larger number of reflections and the diffracted intensity is the integrated intensity. These patterns have strong similarities with the electron precession patterns and they can be used for various applications like the identification of the possible space groups of a crystal from observations of the Lane zones or the ab-initio structure identifications. Since this is a defocused method, another important application concerns the analysis of electron beam-sensitive materials. Successful applications to polymers are given in the present paper to prove the validity of this method with regards to these materials. (c) 2007 Elsevier B.V. All rights reserved.

Equipe: Département SI2M : Microstructures et Contraintes

Tondi, G, Pizzi, A, Pasch, H, Celzard, A and Rode, K
European polymer journal, 44:2938-2943
2008

Equipe: Département CP2S : Matériaux Carbonés

Le Brizoual, L., Krüger, J.K., Elmazria, O., Vincent, B., Bouvot, L., Kolle, M., Rouxel, D. and Alnot, P.
Journal of Physics D: Applied Physics, 41(10)
2008

Equipe: Centre de Compétences : MiNaLor micro et nanotechnologies

BERTHOD, P., LEMOINE, P. and RAVAU, J.
International Journal of Materials Research, 99(9):964-972
2008

Equipe: Département CP2S : Surface et Interface, réactivité chimique des matériaux

ROYER, L., MATHIEU, S., LIEBAUT, C. and STEINMETZ, P.
Materials Science Forum, :1047-1055
2008

Equipe: Département CP2S : Surface et Interface, réactivité chimique des matériaux

Marcos, G., Rhallabi, A. and Ranson, P.
Applied Surface Science, 254(11):3576-3584
2008

Equipe: Département CP2S : Expériences et Simulations des Plasmas Réactifs - Interaction plasma-surface et Traitement des Surfaces ESPRITS

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