Titre: | Sin2psi analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure |
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Auteurs: | Faurie, D., Geandier, G., Renault, P.-O., Le Bourhis, E. and Thiaudière, D. |
Journal: | Thin Solid Films |
Annee: | 2013 |
Volume: | 530 |
Pages: | 25-29 |
Equipe: | Département SI2M : Microstructures et Contraintes |