This file was created by the TYPO3 extension bib --- Timezone: CEST Creation date: 2020-07-09 Creation time: 13-44-34 --- Number of references 4 article CP2S022 Chemistry of Materials 2014 26 16 4765-4775 We present a detailed study of the evolution of the electrical, galvanomagnetic, and thermodynamic properties of polycrystalline AgxMo9Se11 compounds for 3.4 ? x ? 3.8 at low temperatures (2?350 K). In agreement with density functional theory calculations, the collected data show an overall gradual variation in the transport properties from metallic to semiconducting behavior on going from x = 3.4 to 3.8. The results evidence subtle variations in the electronic properties with the Ag content, typified by both positive and negative phonon-drag effects together with thermopower and Hall coefficient of opposite signs. Analysis of the data suggests that these features may be due to peculiarities of the dispersion of the valence bands in the vicinity of the chemical potential. A drastic influence of the Ag content on the thermal transport was evidenced by a pronounced change in the temperature dependence of the specific heat below 10 K. Nonlinearities in the Cp(T3) data are correlated to the concentration of Ag atoms, with an increase in x resulting in a more pronounced departure from a Debye law. The observed behavior mirrors that of ionic conductors, suggesting that AgxMo9Se11 for x ? 3.6 might belong to this class of compounds. Département CP2S : Chimie et électrochimie des matériaux T.ZHOU M.COLIN C.CANDOLFI C.Boulanger A.DAUSCHER E.Santava J.HEJTMANEK P.BARANEK R.AL RAHAL AL ORABI M.POTEL B.Fontaine P.GOUGEON R.Gautier B.LENOIR article CP2S004 Thin Solid Films 2014 571, Part 3 509-512 Abstract We describe a spectroscopic ellipsometer in the visible domain (400–800 nm) based on a rotating compensator technology using two detectors. The classical analyzer is replaced by a fixed Rochon birefringent beamsplitter which splits the incidence light wave into two perpendicularly polarized waves, one oriented at + 45° and the other one at ? 45° according to the plane of incidence. Both emergent optical signals are analyzed by two identical CCD detectors which are synchronized by an optical encoder fixed on the shaft of the step-by-step motor of the compensator. The final spectrum is the result of the two averaged ? and ? spectra acquired by both detectors. We show that ? and ? spectra are acquired without systematic errors on a spectral range fixed from 400 to 800 nm. The acquisition time can be adjusted down to 25 ms. The setup was validated by monitoring the first steps of bismuth telluride film electrocrystallization. The results exhibit that induced experimental growth parameters, such as film thickness and volumic fraction of deposited material can be extracted with a better trueness. Département CP2S : Chimie et électrochimie des matériaux Systematic errors In-situ ellipsometry Electrodeposition Bismuth telluride LaurentBroch NicolasStein AlexandreZimmer YannBattie Aotmane EnNaciri article Schleicher2014 Nature Communications 2014 5 Département P2M : Nanomagnétisme et Electronique de Spin http://www.scopus.com/inward/record.url?eid=2-s2.0-84905482337&partnerID=40&md5=4ccbc88e193e7e394072da0990df284a F.Schleicher U.Halisdemir D.Lacour M.Gallart S.Boukari G.Schmerber V.Davesne P.Panissod D.Halley H.Majjad Y.Henry B.Leconte A.Boulard D.Spor N.Beyer C.Kieber E.Sternitzky O.Cregut M.Ziegler F.Montaigne E.Beaurepaire P.Gilliot M.Hehn M.Bowen article ISI:000336759100005 PHYSICAL REVIEW B 2014 89 19 Département P2M : Surfaces et Spectroscopies 1098-0121 10.1103/PhysRevB.89.195425 V. V.Zheltov V. V.Cherkez B. V.Andryushechkin G. M.Zhidomirov B.Kierren Y.Fagot-Revurat D.Malterre K. N.Eltsov