% 
% This file was created by the TYPO3 extension
% bib
% --- Timezone: CET
% Creation date: 2021-03-03
% Creation time: 07-23-50
% --- Number of references
% 1
% 

@Article { Horwat:2009,
   title = {Properties of nanocrystalline and nanocomposite WxZr1-x thin films deposited by co-sputtering},
   journal = {Intermetallics},
   year = {2009},
   volume = {17},
   number = {6},
   pages = {421-426},
   abstract = {WxZr1-x thin films were deposited at room temperature on glass substrates by co-sputtering tungsten and zirconium targets in argon. The composition was found in the range 0 <= x <= 0.81. The grain size deduced from X-ray diffraction analysis ranged from 1.3 nm to 16 nm depending on the composition. The events in the resistivity, optical reflectivity and thickness evolutions were correlated with the X-ray diffraction analysis. Depending on the composition, the local organization can be attributed to a nanocrystalline solid solution of W in Zr, to a nanocomposite structure involving ZrW2 nanograins embedded in an amorphous matrix. to ZrW2 Laves phase nanograins and to a nanocrystalline solid solution of Zr in W. For 0 < x <= 0.72, the equivalent grain size is very small (less than 2 nm) and the evolution of the resistivity can be fitted by the estimated volume of the material perturbed by the grain boundaries. (C) 2008 Elsevier Ltd. All rights reserved.},
   note = {D{\'e}partement SI2M : Microstructures et Contraintes},
   ISSN = {0966-9795},
   DOI = {10.1016/j.intermet.2008.11.020},
   author = {Horwat, D. and Dehmas, M. and Aubry, E. and Zollinger, J. and Migot, S. and Pierson, J. F.}
}