This file was created by the TYPO3 extension bib --- Timezone: CET Creation date: 2021-03-09 Creation time: 05-12-20 --- Number of references 1 article Horwat:2009 Intermetallics 2009 17 6 421-426 WxZr1-x thin films were deposited at room temperature on glass substrates by co-sputtering tungsten and zirconium targets in argon. The composition was found in the range 0 <= x <= 0.81. The grain size deduced from X-ray diffraction analysis ranged from 1.3 nm to 16 nm depending on the composition. The events in the resistivity, optical reflectivity and thickness evolutions were correlated with the X-ray diffraction analysis. Depending on the composition, the local organization can be attributed to a nanocrystalline solid solution of W in Zr, to a nanocomposite structure involving ZrW2 nanograins embedded in an amorphous matrix. to ZrW2 Laves phase nanograins and to a nanocrystalline solid solution of Zr in W. For 0 < x <= 0.72, the equivalent grain size is very small (less than 2 nm) and the evolution of the resistivity can be fitted by the estimated volume of the material perturbed by the grain boundaries. (C) 2008 Elsevier Ltd. All rights reserved. Département SI2M : Microstructures et Contraintes 0966-9795 10.1016/j.intermet.2008.11.020 D.Horwat M.Dehmas E.Aubry J.Zollinger S.Migot J. F.Pierson