Titre: | Analysis of carrier parameters and bandgap of electroplated Bi2Te3 films by infrared spectroscopic ellipsometry |
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Auteurs: | Zimmer, A., Stein, N., Terryn, H., Johann, L. and Boulanger, C. |
Journal: | Physica Status Solidi C - Current Topics in Solid State Physics |
Annee: | 2008 |
Volume: | 5 |
olabel_issue: | 5 |
Pages: | 1190-1193 |
Equipe: | Département CP2S : Chimie et électrochimie des matériaux |