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Articles:

Aeby-Gautier, E., Bruneseaux, F., Teixeira, J. Da Costa, Appolaire, B., Geandier, G. and Denis, S.
Journal of Materials, 59(1):54-58
2007
ISSN: 1047-4838

Resume: The prediction of microstructure during processing needs to characterize the phase transformation occurring during the thermal treatments and their kinetics. In-situ high-energy synchrotron x-ray diffraction experiments performed during temperature variations allow the characterization of the phase evolution. For some transformation conditions, the continuous recording of diffraction diagrams evidences clearly intermediate phases. The quantitative analysis of the diffraction diagrams gives the transformation kinetics of each phase as well as their cell parameters. Transformation kinetics obtained by this method are compared to results obtained by electrical resistivity.

Equipe: Département SI2M : Département SI2M : Microstructures et Contraintes

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