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Publications: Articles

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References

2014

Articles:

Djaziri, S., Renault, P.-O., Le Bourhis, E., Goudeau, Ph., Faurie, D., Geandier, G., Mocuta, C. and Thiaudière, D.
Journal of Applied Physics, 116:093504
2014

Equipe: Département SI2M : Microstructures et Contraintes

Geandier, G., Faurie, D., Renault, P.-O., Thiaudière, D. and Le Bourhis, E.
Journal of Applied Crystallography, 47:181-187
2014

Equipe: Département SI2M : Microstructures et Contraintes

Faurie, D., Renault, P.-O., Le Bourhis, E., Geandier, G., Goudeau, P. and Thiaudière, D.
Applied Surface Science, 306:70--74
2014
ISSN: 0169-4332

Equipe: Département SI2M : Microstructures et Contraintes

2013

Articles:

Faurie, D., Geandier, G., Renault, P.-O., Le Bourhis, E. and Thiaudière, D.
Thin Solid Films, 530:25-29
2013

Equipe: Département SI2M : Microstructures et Contraintes

Djaziri, S., Faurie, D., Renault, P.-O., Le Bourhis, E., Goudeau, Ph., Geandier, G. and Thiaudière, D.
Acta Materialia, 61:5067--5077
2013

Equipe: Département SI2M : Microstructures et Contraintes

2011

Articles:

Faurie, D., Renault, P. -O., Geandier, G. and Le Bourhis, E.
Thin Solid Films, 520(5):1603-1607
2011
ISSN: 0040-6090

Resume: Synchrotron x-ray radiation was used for in situ strain measurements in gold films on polyimide substrate during uniaxial deformation tests. We have used an area detector that allows inspecting multiple directions in the polycrystalline thin film without serial sectioning during straining. We show in this paper the configuration used and the attainable orientations on a pole figure for which the x-ray strains are measured. Moreover, we show the effect on the x-ray strains of the onset on plasticity, which was not detected by optical (macroscopic) strain measurement. (C) 2011 Elsevier B.V. All rights reserved.

Equipe: Département SI2M : Microstructures et Contraintes

Total:
6
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