||Time resolved synchrotron x-ray strain measurements of gold thin film on flexible substrate
|| Faurie, D., Renault, P. -O., Geandier, G. and Le Bourhis, E.
||Thin Solid Films
||Synchrotron x-ray radiation was used for in situ strain measurements in gold films on polyimide substrate during uniaxial deformation tests. We have used an area detector that allows inspecting multiple directions in the polycrystalline thin film without serial sectioning during straining. We show in this paper the configuration used and the attainable orientations on a pole figure for which the x-ray strains are measured. Moreover, we show the effect on the x-ray strains of the onset on plasticity, which was not detected by optical (macroscopic) strain measurement. (C) 2011 Elsevier B.V. All rights reserved.
||Département SI2M : Microstructures et Contraintes