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2011

Articles:

Faurie, D., Renault, P. -O., Geandier, G. and Le Bourhis, E.
Thin Solid Films, 520(5):1603-1607
2011
ISSN: 0040-6090

Resume: Synchrotron x-ray radiation was used for in situ strain measurements in gold films on polyimide substrate during uniaxial deformation tests. We have used an area detector that allows inspecting multiple directions in the polycrystalline thin film without serial sectioning during straining. We show in this paper the configuration used and the attainable orientations on a pole figure for which the x-ray strains are measured. Moreover, we show the effect on the x-ray strains of the onset on plasticity, which was not detected by optical (macroscopic) strain measurement. (C) 2011 Elsevier B.V. All rights reserved.

Equipe: Département SI2M : Microstructures et Contraintes

2009

Articles:

Ammar, Kais, Appolaire, Benoit, Cailletaud, Georges and Forest, Samuel
European Journal of Computational Mechanics, 18(5-6):485-523
2009
ISSN: 1779-7179

Equipe: Département SI2M : Microstructures et Contraintes

Ammar, Kais, Appolaire, Benoit, Cailletaud, Georges, Feyel, Frederic and Forest, Samuel
Computational Materials Science, 45(3):800-805
2009
ISSN: 0927-0256

Equipe: Département SI2M : Microstructures et Contraintes

2008

Articles:

Fréchard, S., Redjaïmia, A., Lach, E. and Lichtenberger, A.
Materials Science and Engineering A, 480:89-95
2008

Equipe: Département SI2M : Microstructures et Contraintes

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