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@Conference { Aubert20101490,
   title = {Reliability of AlN/sapphire bilayer structure for high-temperature SAWapplications},
   journal = {Proceedings - IEEE Ultrasonics Symposium},
   year = {2010},
   pages = {1490-1493},
   note = {Centre de Comp{\'e}tences : MiNaLor micro et nanotechnologies},
   web_url = {http://www.scopus.com/inward/record.url?eid=2-s2.0-80054081700\&partnerID=40\&md5=98ae9dfab4452c82135a028967301fcb},
   author = {Aubert, T. and Elmazria, O. and Assouar, B. and Hamdan, A. and Geneve, D.}
}