This file was created by the TYPO3 extension
bib
--- Timezone: CEST
Creation date: 2020-04-08
Creation time: 01-59-29
--- Number of references
1
conference
Aubert20101490
Reliability of AlN/sapphire bilayer structure for high-temperature SAWapplications
Proceedings - IEEE Ultrasonics Symposium
2010
1490-1493
Centre de Compétences : MiNaLor micro et nanotechnologies
http://www.scopus.com/inward/record.url?eid=2-s2.0-80054081700&partnerID=40&md5=98ae9dfab4452c82135a028967301fcb
T.Aubert
O.Elmazria
B.Assouar
A.Hamdan
D.Geneve