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Publications: Articles

Toutes :: 2009
Tous :: A, B, C, D, E, F, G, H, I, J, K, L, M, N, P, R, S, T, V, W, X, Y, Z 
Tous :: Zollinger 
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Horwat, D., Dehmas, M., Aubry, E., Zollinger, J., Migot, S. and Pierson, J. F.
Intermetallics, 17(6):421-426
ISSN: 0966-9795

Resume: WxZr1-x thin films were deposited at room temperature on glass substrates by co-sputtering tungsten and zirconium targets in argon. The composition was found in the range 0 <= x <= 0.81. The grain size deduced from X-ray diffraction analysis ranged from 1.3 nm to 16 nm depending on the composition. The events in the resistivity, optical reflectivity and thickness evolutions were correlated with the X-ray diffraction analysis. Depending on the composition, the local organization can be attributed to a nanocrystalline solid solution of W in Zr, to a nanocomposite structure involving ZrW2 nanograins embedded in an amorphous matrix. to ZrW2 Laves phase nanograins and to a nanocrystalline solid solution of Zr in W. For 0 < x <= 0.72, the equivalent grain size is very small (less than 2 nm) and the evolution of the resistivity can be fitted by the estimated volume of the material perturbed by the grain boundaries. (C) 2008 Elsevier Ltd. All rights reserved.

Equipe: Département SI2M : Microstructures et Contraintes

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