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Publications: Articles

Toutes :: 2002, ... , 2012, 2013, 2014, ... , 2016
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References par page: Mots clefs Voir les resumes


Ochoa, E.A., Droppa, R., Basso, R.L.O., Morales, M., Cucatti, S., Zagonel, L.F., Czerwiec, T., Dos Santos, M.C., Figueroa, C.A. and Alvarez, F.
Materials Chemistry and Physics, 143:116-123

Resume: The low energy (similar to 50-350 eV) noble gases ion bombardment of the steel surface shows that the pre-treatments increase nitrogen diffusion by modifying the outermost structure of the material. The surface microstructure and morphology of the studied samples were characterized by Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM). The crystalline and chemical structures in the outermost layers of the surface were analyzed by grazing angle X-ray diffraction (GAXRD) and photoemission electron spectroscopy (XPS). Temperature effusion studies of the implanted ions are used to elucidate the noble gases site localization in the network. The local compressive stress induced by the nearby iron atoms on the core level electron wave functions of the trapped noble gases are studied by photoemission electron spectroscopy (XPS) and interpreted considering a simple mechanical model. Nano-hardness measurements show the dependence of the material elastic constant on the energy of the implanted noble gases. Although the ion implantation range is about few nanometers, the atomic attrition effect is larger enough to modify the material structure in the range of micrometers. Two material stress zones were detected where the outermost layers shows compressive stress and the underneath layers shows tensile stress. The implanted noble gases can be easily removed by heating. A diffusion model for polycrystalline-phase systems is used in order to discuss the influence of the atomic attrition on the N diffusion coefficient. The concomitant effect of grain refining, stress, and surface texture on the enhancing nitrogen diffusion effect is discussed.

Equipe: Département CP2S : Expériences et Simulations des Plasmas Réactifs - Interaction plasma-surface et Traitement des Surfaces ESPRITS

Armbruester, M., Behrens, M., Foettinger, K., Friedrich, M., Gaudry, E., Matam, S. K. and SHARMA, H. R.
ISSN: 0161-4940

Equipe: Département CP2S : Métallurgie et Surfaces

Lundin, D., Vitelaru, C., Poucques, De, Brenning, N. and Minea., T.
Journal of Physics D: Applied Physics, 46:175201

Resume: A 3D Monte Carlo code (OMEGA) was developed to simulate the transport of sputtered atoms in a magnetron discharge operating in direct current mode. Collisions between the sputtered Ti atoms and the neutral process gas atoms (Ar) were modelled. Spatially resolved simulated velocity distributions of the sputtered particles parallel as well as perpendicular to the cathode surface for different operating pressures were recorded and benchmarked against experimentally obtained profiles using laser-induced fluorescence. New differential (angular and energy-dependent) cross sections for Ti-Ar elastic collisions were thereby obtained, which resulted in good agreement between modelled and experimental results. The differences with respect to commonly used extrapolated Ar-Ar cross sections to describe the Ti-Ar interaction are highlighted and discussed.

Equipe: Département CP2S : Expériences et Simulations des Plasmas Réactifs - Interaction plasma-surface et Traitement des Surfaces ESPRITS

Fagot-Revurat, Y., Tournier-Colletta, C., Chaput, L., Tejeda, A., Cardenas, L., Kierren, B., Malterre, D., Le Fèvre, P., Bertran, F. and Taleb-Ibrahimi, A.
ISSN: 0953-8984

Equipe: Département P2M : Surfaces et Spectroscopies

Van Landeghem, H.P., Goune, M., Epicier, T. and Redjaïmia, A.
Scripta Materialia, 68:187--190

Equipe: Département SI2M : Microstructures et Contraintes

Wang, F., Liu, G., Rothwell, S., Nevius, M., Tejeda, A., Taleb-Ibrahimi, A., Feldman, L. C., Cohen, P. I. and Conrad, E. H.
NANO LETTERS, 13(10):4827-4832
ISSN: 1530-6984

Equipe: Département P2M : Surfaces et Spectroscopies

Djaziri, S., Faurie, D., Renault, P.-O., Le Bourhis, E., Goudeau, Ph., Geandier, G. and Thiaudière, D.
Acta Materialia, 61:5067--5077

Equipe: Département SI2M : Microstructures et Contraintes

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