Microscopy (SEM, SEM-FIB, TEM), Castaing Microprobe

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Material characterization tools using different structure and/or microstructure analysis techniques

Characterization of materials by different electron microscopy and microanalysis techniques (TEM, SEM, microprobe)
Preparation of cross sectional lamella using FIB
Characterization of materials at different scales from a few nanometers to a few hundred micrometers depending on the techniques used
Qualitative and quantitative composition analyses
2 Transmission Electron Microscopes
2 Scanning Electron Microscopes
1 Scanning Electron Microscope with focused ion beam
1 Electronic Castaing Microprobe