Diffraction, Diffusion, Fluorescence (XRF) and X-ray Tomography, Mössbauer Spectroscopy (X-Gamma)

• 10 X-ray diffractometers
• 3 Mössbauer spectrometers
• 1 X-ray fluorescence spectrometer
• 1 NanoTomograph

• Belgacem, Faicel, Raphaël Schneider, Jean-François Portha, Ghouti Medjahdi, Lavinia Balan, Ksenia Parkhomenko, Anne-Cécile Roger, et Laurent Falk. « Influence of Perovskite Catalysts Synthesis Methods: Application to Dry Methane Reforming ». International Journal of Hydrogen Energy 91 (novembre 2024): 977‑88. https://doi.org/10.1016/j.ijhydene.2024.10.119.

• Gračanin, Nik, Matejka Podlogar, Sorour Semsari Parapari, Pascal Boulet, Francisco Ruiz-Zepeda, Sašo Šturm, et Nastja Rogan Šmuc. « Formation Mechanisms and Environmental Influences on the Crystal Growth of Wulfenite ». Scientific Reports 14, no 1 (22 avril 2024): 9234. https://doi.org/10.1038/s41598-024-60043-4.

• Li, Shu, Zi’an Zhang, Wenjie Gu, Maël Gallas, David Jones, Pascal Boulet, Lindsay M. Johnson, Victoire De Margerie, et Gavin P Andrews. « Hot Melt Extruded High-Dose Amorphous Solid Dispersions Containing Lumefantrine and Soluplus ». International Journal of Pharmaceutics 665 (novembre 2024): 124676. https://doi.org/10.1016/j.ijpharm.2024.124676.

• Magri, Pierre, Pascal Franchetti, Jean-Jacques Gaumet, Benoit Maxit, Sébastien Diliberto, et Philippe Pierrat. « Upgrading Biomass Wastes to Graphene Quantum Dots with White-Light-Emitting Features in the Solid State ». Applied Sciences 14, no 19 (30 septembre 2024): 8807. https://doi.org/10.3390/app14198807.

The X-Gamma competence center is particularly well equipped to:

• Determine the phase in a sample, qualitatively and quantitatively in all powder or bulk sample
• Determine the residual stress/textures in bulk or thin film sample
• Solve the crystal structure based on single crystal data and on powder data
• Measure the reactivity of a sample depending on the temperature under all kind of oxydo-reductive atmosphere
• Determine the thickness of thin film by X-ray reflectometry
• Determine precisely the chemical compostion by X-ray fluorescence
• Train in material characterization techniques(measurements and data processing using specific softwares)

• Pascal BOULET
• Sébastien DILIBERTO
• Olivier FERRY
• Ghouti MEDJAHDI