Diffraction, Diffusion, Fluorescence (XRF) and X-ray Tomography, Mössbauer Spectroscopy (X-Gamma)

• 10 X-ray diffractometers
• 3 Mössbauer spectrometers
• 1 X-ray fluorescence spectrometer
• 1 NanoTomograph

• Bottom-Up Confined Synthesis of Nanorod-in-Nanotube Structured Sb@N-C for Durable Lithium and Sodium Storage, Wen Luo et al Adv., Energy Mater. 2018, 8, 1703237
   
• Crystalline and Electronic Structures of the Al _{1+ x} V ₂ Sn _{2– x} ( x = 0.19) Intermetallic Compound,
  Boulet Pascal, et al., Inorg. Chem. 2020 59, 360–366
   
• Epitaxial growth of magnetostrictive TbFe2 films on piezoelectric LiNbO3, Vincent Polewczyk et al., J. Phys.: Condens. Matter 31 (2019) 405801
   
• Spherical depth-sensing nanoindentation to characterize human anterior skull basebones: establishment of a test protocol, Valentin Favier, Patrice Gallet, Olivier Ferry, Jean-Philippe Jehl, Journal of the Mechanical Behavior of Biomedical Materials, 2020 (accepted publication)

The X-Gamma competence center is particularly well equipped to:

• Determine the phase in a sample, qualitatively and quantitatively in all powder or bulk sample
• Determine the residual stress/textures in bulk or thin film sample
• Solve the crystal structure based on single crystal data and on powder data
• Measure the reactivity of a sample depending on the temperature under all kind of oxydo-reductive atmosphere
• Determine the thickness of thin film by X-ray reflectometry
• Determine precisely the chemical compostion by X-ray fluorescence
• Train in material characterization techniques(measurements and data processing using specific softwares)

• Pascal BOULET
• Sébastien DILIBERTO
• Olivier FERRY
• Ghouti MEDJAHDI