Microscopies, Microprobes and Metallography Competence Center (CC 3M)

The Microscopies, Microprobes and Metallography competence center (CC3M) provides several instruments for imaging and analyses:

• 2 transmission electron microscopes (TEM) with high resolution electron source FEG (JEOL)
• 1 conventional transmission electron microscope, with LaB6 source (FEI)
• 1 scanning electron microscope equipped with focused ion beam (FIB) (FEI)
• 2 scanning electron microscopes (SEM) source FEG (ZEISS, FEI)
• 1 Castaing microprobe, source FEG (JEOL)
• 1 metallography facility

• Ultrafast Melting of Metal-Organic Frameworks for Advanced Nanophotonics, NK. Kulachenkov, S. Bruyere, SA. Sapchenko, YA. Mezenov, D.Sun, AA. Krasilin, A. Nomine, J. Ghanbaja, T. Belmonte, V.P Fedin, EA. Pidko, VA. Milichko., Advanced Functional Materials, Article Number: 1908292, 2019, (IF 15.6)
   
• Local Structure and Point-Defect-Dependent Area-Selective Atomic Layer Deposition Approach for Facile Synthesis of p-Cu2O/n-ZnO Segmented Nanojunctions, C. De Melo, M. Jullien, J. Ghanbaja, F. Montaigne, JF. Pierson, F. Soldera, F. Rigoni, N. Almqvist, A. Vomiero, F. Muecklich, D. Horwat., ACS Applied Materials and Interfaces, Volume: 10, Issue: 43, Pages: 37671-37678, Published: Oct 2018, (IF 8.7)
   
• Controlling surface morphology by nanocrystalline/amorphous competitive self-phase separation in thin films: Thickness-modulated reflectance and interference phenomena, A. Borroto ; S. Bruyère ; S. Migot ; J.F. Pierson ; T. Gries ; D. Horwat., Acta Materalia, Volume 181, Pages 78-86, December 2019, (IF 7.3)
   
• Understanding the mechanisms of Si-K-Ca glass alteration using silicon isotopes, A. Verney-Carron, L. Sessegolo, M. Saheb, N. Valle, P. Ausset, R. Losno, D. Mangin, T. Lombardo, A. Chabas, C. Loisel., Geochimica et Cosmochimica Acta, Volume: 203, Pages: 404-421, 2017 (IF 4.2)
   
• Chemical environment and functional properties of highly crystalline ZnSnN2 thin films deposited by reactive sputtering at room temperature, F. Alnjiman, S. Diliberto, J. Ghanbaja, E. Haye, S. Kassavetis, P. Patsalas, C. Gendarme, S. Bruyere, F. Cleymand, P.Miska, JF. Pierson, Solar Energy Materials and Solar Cells, Volume: 182, Pages: 30-36, 2018, (IF 6)
   
• Structural Characterisation and Chemical Stability of Commercial Fibrous Carbons in Molten Lithium Salts, Blagoj Karakashov, Vanessa Fierro, Sandrine Mathieu, Philippe Gadonneix, Ghouti Medjahdi, Alain Celzard, Materials (dec 2019):12(24)-4232 (IF 3)
   
• All-Optical Nanoscale Heating and Thermometry with Resonant Dielectric Nanoparticles for Controllable Drug Release in Living Cells, GP. Zograf, AS. Timin, AR. Muslimov, II. Shishkin, A. Nomine, J. Ghanbaja, P. Ghosh, Q. Li, MV. Zyuzin, SV. Makarov, Laser & Photonics Reviews, Article Number: 1900082, 2020 (IF 9)

• Morphological and chemical characterization of materials based on SEM and / or TEM
• Castaing microprobe chemical analyses
• Electron diffraction by TEM
• High resolution TEM and STEM imaging mode
• EBSD mapping (phase and orientation maps)
• FIB micromachining for ultrathin films
• Hardness measurements, milling, optical microscopy
• SEM, TEM, FIB training courses (instrument operation courses)

• Stéphanie BRUYERE
• Mélanie EMO
• Erwan ETIENNE
• Christine GENDARME
• Jaafar GHANBAJA
• Pauline HARAUX
• Sylvie MIGOT