Characterization of nanomaterials

Programme :
• 14:00-14:15: Slavisa Jovanovic, IEEE I&M Chapter France - Introduction
• 14:15-15:00: Mathias Bonmarin, Lock-in thermal imaging to investigate stimuli-
responsive nanomaterials in complex environments.
• 15:00-15:30: José Moran, Calibrated measurements of dopant concentration on GaAs
vertical nanowire arrays by scanning microwave microscopy
• 15:30-16:00: Pascal Boulet, Nanomaterials characterization within the XGamma
competence center of IJL
• 16:00-16:30: Pause café
• 16:30-17:00: François-Xavier Ouf & Valérie Godefert, NanoMesureFrance: A single
entry point for structuring the nanomaterials industry around reliable data
• 17:00-17:30: Daniel Lacour, Magnetic textures imaging by Scanning NV magnetometry

Workshop organized as part of IEEE I&M Chapter France and the Mat-Pulse Interdisciplinary Program.