Magnetic measurement of thin films, nanoparticles and nanomaterials

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Magnetic measurement of thin films,  nanoparticles and nanomaterials
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Your needs

  • Characterize materials containing Co, Fe, Ni, rare earths, Characterize diamagnetic, paramagnetic, ferromagnetic, ferrimagnetic, antiferromagnetic and superconducting materials
  • Measure magnetization
  • Magnetic susceptibility measurement
  • Measure magnetic permeability (low frequency AC and DC)  
  • Measure dynamic properties (dynamic magnetic susceptibility, gyromagnetic ratio, magnetic damping)   
  • Coercive field or magnetic anisotropy measurement
  • Measure the Curie temperature
  • To simulate the magnetic field generated by a magnetic or electrical system
  • Carry out magnetic measurements as a function of magnetic field, temperature and field angle
  • Carry out highly sensitive magnetic measurements
  • To study different types of sample: polycrystalline or monocrystalline solids, thin films, powders, nanomaterials (nanoparticles, nanowires, nanotubes, etc.), liquids
  • Measurement can be done from 2 to 1000 Kelvin
  • Measurement cab be done between 0 and 9 Tesla

Our solutions

  • Magnetic measurement consultancy (dedicated engineers and researchers)
  • Machine training and then lending one of our 9 magnetometers (VSM, SQUID, Susceptometer)
  • Measurement service with one of our 9 magnetometers (VSM, SQUID, Susceptometer)
  • Realization of a partnership R&D project
  • Magnetic field simulation (FEMM, COMSOL)
  • Lifelong learning in the field of magnetic measurement (magnetometry)   
  • If necessary, linking up with other centers in the networks of national and European magnetometry
  • Our offers are eligible for Research Tax Credit

Keywords

  • Magnetism
  • Magnetic Characterization
  • Magnetization
  • Susceptibility
  • Permeability
  • Curie Temperature
  • Coercive Field
  • Magnetic Field 
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Related skills

  • Probe, control and functionalize the magnetism of matter
  • Intermetallic compounds
  • Nanofabrication  
  • Thin film deposition and characterization
  • Growth of nanomaterials
  • Chemical characterization (Spectroscopies, etc.)
  • Structural characterization (AFM, TEM, XRD, etc.)
  • Electrical measurements
  • Numerical simulation and scientific calculation

Contact

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