Images

Colonne

Contenu

Analyses

• Identification of crystalline phases (XRD, TEM)   
• Identification of crystalline structures (XRD, TEM)
• Determination of grain size (TEM, SEM, XRD)  
• Analyses of residual constraints (XRD)
• Identification and quantification of chemical elements by energy loss spectroscopy (TEM/STEM-EELS) and X-ray photon energy dispersive spectroscopy (STEM-EDS)
• Morphology analysis (SEM, XRD)  
• Determination of layer thicknesses, layer roughness (SEM, XRD)
• Determination of valency (Mössbauer)

Samples

• Powders 
• Massive samples 
• Thin films
• Nanoparticles  
• Organic / Inorganic  
• Insulator / Conductor   
• Monocrystal / Polycrystal 

Keywords

• XRD
• SEM
• TEM
• STEM
• EDS
• EELS
• Tomography
• Crystal structure
• X-Map
• Mössbauer

Contenu

Imaging

• Surface image (SEM):
  - Topographic Image (SE)
  - Chemical image (BSE) 
• High resolution imaging in TEM/STEM with a resolution of 0.12 nm in TEM and 0.08 nm in STEM 
• Conventional TEM imaging (BF, DF)  
• Electronic diffraction in TEM 
• X-mapping (EDS) in STEM mode 
• X-ray tomography: 3D image (XRD) 

Options

• Analysis under different controlled atmospheres: neutral, reducing or oxidising (XRD) 
• Temperature-dependent analysis between 10 K and 2573 K (XRD) 
• Specimen holder for in situ experimentation (TEM):
  - Heated up to 1000°
  - Cryogenic up to 77K 

Contact

• Contact the research group:
  stephanie.bruyere@univ-lorraine.fr
  +33 (0) 3 72 74 25 83
  p.boulet@univ-lorraine.fr
  +33 (0) 3 72 74 25 18
   
• Contact the technological transfer office (TTO):
  ijl-tto@univ-lorraine.fr
  +33 (0) 3 72 74 26 04

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