X-Ray Diffraction, Mössbauer Spectroscopy, Tomography

Your needs

Tools to characterize materials using different structural and/or microstructural analysis techniques
Texture and residual stress measurements
Chemical environmental measurements to reconstruct the volume of an object
A non-destructive transmission X-ray imaging technique

Determine the phase in a sample, qualitatively and quantitatively in all powder or bulk sample
Determine the residual stress/textures in bulk or thin film sample
Measure the reactivity of a sample depending on the temperature (77K to 1200°C) under all kind of atmosphere (oxydo-reductive, neutral or under vacuum)
Determine the thickness of thin film by X-ray reflectometry
Determine precisely the chemical compostion by X-ray fluorescence
Train in material characterization techniques(measurements and data processing using specific softwares)
Our offers are eligible for Research Tax Credit

Structural and microstructural analysis by electron microscopy (SEM, TEM)
Deposition and characterization of thin films under ultra-high-vacuum (D.A.U..M. Tube)

Contact the research group:
p.boulet@univ-lorraine.fr
+33 (0) 3 72 74 25 18
Contact the technology transfer office (TTO):
ijl-tto@univ-lorraine.fr
+33 (0) 3 72 74 26 04